首页> 外国专利> A METHOD AND SYSTEM FOR COMPARING TWO QUANTUM STATES

A METHOD AND SYSTEM FOR COMPARING TWO QUANTUM STATES

机译:一种比较两个量子态的方法和系统

摘要

A method for comparing two quantum states comprises providing a first quantum state at a first node, transforming the first quantum state with a first plurality of unitary operations to obtain a first plurality of transformed quantum states, and measuring the first plurality of transformed quantum states with a first set of quantum measurements to obtain a first set of measurement results. The method further comprises providing a second quantum state at a second node, transforming the second quantum state with a second plurality of unitary operations to obtain a second plurality of transformed quantum states, wherein the second plurality of unitary operations corresponds to the first plurality of unitary operations, and measuring the second plurality of transformed quantum states with a second set of quantum measurements to obtain a second set of measurement results. The method further comprises determining a similarity measure between the first quantum state and the second quantum state in terms of the first set of measurement results and the second set of measurement results, wherein the similarity measure comprises a trace product of the first quantum state and the second quantum state.
机译:用于比较两个量子状态的方法包括在第一节点处提供第一量子状态,使第一量子状态与第一多个整体操作转换,以获得第一多个变换的量子状态,并测量第一多个变换的量子状态第一组量子测量,以获得第一组测量结果。该方法还包括在第二节点处提供第二量子状态,将第二量子状态与第二多个整体操作变换以获得第二多个变换的量子状态,其中第二多个整体操作对应于第一多个整体使用第二组量子测量测量第二多个变换量子状态,以获得第二组测量结果。该方法还包括:根据第一组测量结果和第二组测量结果,确定第一量子状态和第二量子状态之间的相似度测量,其中相似度测量包括第一量子状态的跟踪乘积和第二量子状态。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号