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Analysis method for trace harmful substances in polymer resin using matrix correction XRF method

机译:基质校正XRF法的痕量有害物质分析方法XRF方法

摘要

The present invention relates to a method for analyzing trace harmful substances in a polymer resin using a matrix-corrected XRF method. In particular, compared to the conventional analysis, the standard sample and the analysis sample require a resin having the same or similar X-ray absorption rate, In the case of the present invention, it is possible to create a calibration curve even with different numbers, and analysis thereof is possible. Therefore, when the matrix-corrected XRF method of the present invention is applied, difficulties in preparing and securing a standard sample can be solved, and various polymer resins can be analyzed without difficulty.
机译:本发明涉及使用基质校正的XRF方法分析聚合物树脂中痕量有害物质的方法。特别地,与常规分析相比,标准样品和分析样品需要具有相同或相似的X射线吸收速率的树脂,在本发明的情况下,即使具有不同的数字也可以创建校准曲线并且其分析是可能的。因此,当施加本发明的基质校正的XRF方法时,可以求解制备和固定标准样品的困难,并且可以毫无困难地分析各种聚合物树脂。

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