首页> 外国专利> Probe electrospray ionization unit and ion analyzer

Probe electrospray ionization unit and ion analyzer

机译:探针电喷雾电离单元和离子分析仪

摘要

In the probe electrospray ionization unit 10 used to collect and ionize the sample S set on the sample plate 109 using the probe 106, the sample S is fixed to the substrate (11, 12) and the substrate (11, 12). In addition, the sample plate holding portion 108 that holds the sample plate 109 in a predetermined position and the uniaxial movement that is a direction that is close to and away from the sample plate 109 that is held by the sample plate holding portion 108 are allowed, and the like. A probe holding portion 105 for holding the probe 106 and a probe moving mechanism for moving the probe holding portion 105 in the uniaxial direction, which are attached to the bases (11, 12) so as to restrict the movement in the direction of 32, 33) and a voltage application unit 17 that applies a voltage to the probe 106 held by the probe holding unit 15.
机译:在使用探针106的用于收集和电离样品板109上的样品S的探针电离电离单元10中,样品S固定到基板(11,12)和基板(11,12)。另外,将样品板109保持在预定位置和单轴运动的样品板保持部分108,其是靠近由样品板保持部分108保持的样品板109接近和远离样品板109的方向等等。用于保持探针106的探针保持部分105和探针移动机构,用于将探针保持部分105移动在单轴方向上,它们附接到基座(11,12),以便在32的方向上限制移动,如图33所示,电压施加单元17施加到由探针保持单元15保持的探针106的电压。

著录项

  • 公开/公告号JPWO2019234919A1

    专利类型

  • 公开/公告日2021-05-13

    原文格式PDF

  • 申请/专利权人 株式会社島津製作所;

    申请/专利号JP20200523958

  • 发明设计人 藤岡 真悟;

    申请日2018-06-08

  • 分类号G01N27/62;H01J49/16;H01J49/42;H01J49/04;

  • 国家 JP

  • 入库时间 2022-08-24 18:41:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号