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Test control circuit, semiconductor memory apparatus and semiconductor system using the test control circuit
Test control circuit, semiconductor memory apparatus and semiconductor system using the test control circuit
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机译:使用测试控制电路测试控制电路,半导体存储器装置和半导体系统
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摘要
A test control circuit includes a test mode generation circuit. The test mode generation circuit may be configured to generate, while in a fast access mode, a fast test mode signal based on information included in one of a plurality of mode signals and a fast set signal. The test mode generation circuit may be configured to generate, while in a normal mode, a normal test mode signal based on information included in two or more mode signals from the plurality of mode signals and a normal set signal.
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