Functional built-in self-test architecture in an emulation system

摘要

An emulation system may have a built-in self-test circuit to generate one or more built-in self-test instructions. The one or more built-in self-test instructions may be pseudorandom. The one or more built-in self-test instructions may cause one or more emulation processors of the emulation system to generate one or more deterministic outputs. A testing processor of the emulation system may compare the one or more deterministic outputs to detect a faulty emulation processor, a faulty emulation processor cluster, or a faulty emulation chip of the emulation system.