首页> 外国专利> METHOD AND APPARATUS FOR THREE-DIMENSIONAL ON-LINE MONITORING OF WARPAGE DEFORMATION AND DEFECT OF ENCAPSULATION MODULE

METHOD AND APPARATUS FOR THREE-DIMENSIONAL ON-LINE MONITORING OF WARPAGE DEFORMATION AND DEFECT OF ENCAPSULATION MODULE

机译:用于三维在线监测的翘曲变形和封装模块缺陷的方法和装置

摘要

Disclosed are a method and apparatus for three-dimensional on-line monitoring of a warpage deformation and defect of an encapsulation module. The apparatus comprises a projection moiré module, an X-ray module and a monitoring analysis module. The method comprises: obtaining, by means of the projection moiré module, first warpage information of an encapsulation module sample to be monitored; obtaining, by means of the X-ray module, second warpage information of the encapsulation module sample to be monitored; and obtaining monitoring result information according to the first warpage information and the second warpage information. The problem in the prior art of it not being possible to perform three-dimensional on-line monitoring on a warpage deformation and defect of an encapsulation module is thus solved, and the three-dimensional on-line monitoring can be performed with regard to the failure condition of an encapsulation module for an electronic device in an actual industrial production process.
机译:公开了一种用于三维在线监测封装模块的翘曲变形和缺陷的三维在线监测的方法和装置。该装置包括投影Moiré模块,X射线模块和监测分析模块。该方法包括:通过投影Moiré模块获得待监测封装模块样本的第一翘曲信息;通过X射线模块获得待监测的封装模块样本的第二翘曲信息;并根据第一翘曲信息和第二翘曲信息获得监视结果信息。由此解决了现有技术中的问题,由此解决了在垂直模块的翘曲变形和封装模块的缺陷上执行三维在线监测,并且可以在线上执行三维在线监测实际工业生产过程中电子设备封装模块的故障状况。

著录项

  • 公开/公告号WO2021073310A1

    专利类型

  • 公开/公告日2021-04-22

    原文格式PDF

  • 申请/专利权人 WUHAN UNIVERSITY;

    申请/专利号WO2020CN113768

  • 发明设计人 CHEN ZHIWEN;LIU SHENG;LIU LI;WANG LICHENG;

    申请日2020-09-07

  • 分类号G01B11/16;G01B15/06;G01N21/88;G01N23/044;

  • 国家 CN

  • 入库时间 2022-08-24 18:22:39

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