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PRODUCT DEFECT DETECTION METHOD AND APPARATUS, ELECTRONIC DEVICE AND STORAGE MEDIUM

机译:产品缺陷检测方法和设备,电子设备和存储介质

摘要

The present application relates to the fields of computer vision, image processing, deep learning, cloud computing, and the like, and discloses a product defect detection method, an apparatus, an electronic device, a storage medium, and a computer program. A specific implementation method is to acquire a multi-channel image of a target product; Input the multi-channel image to the defect detection model, the defect detection model includes a plurality of convolutional branches, fusion modules, and convolutional full branches; Performing feature extraction for each channel in the multi-channel image using a plurality of convolution branches to obtain a plurality of first feature information; Fusing the plurality of first feature information using the fusing module to obtain second feature information; Performing feature extraction on the second feature information using the entire branch of the convolution to obtain third feature information output by the defect detection model; According to the third feature information, defect information of the target product is determined. By implementing the technical solution of the present application, the fusion effect of various features can be reinforced.
机译:本申请涉及计算机视觉,图像处理,深度学习,云计算等领域,并公开了产品缺陷检测方法,装置,电子设备,存储介质和计算机程序。具体的实现方法是获取目标产品的多通道图像;将多通道图像输入到缺陷检测模型中,缺陷检测模型包括多个卷积分支,融合模块和卷积的全分支;使用多个卷积分支对多通道图像中的每个信道执行特征提取,以获得多个第一特征信息;使用定影模块融合多个第一特征信息以获得第二特征信息;使用卷积的整个分支对第二特征信息执行特征提取,以获得缺陷检测模型输出的第三特征信息;根据第三特征信息,确定目标产品的缺陷信息。通过实施本申请的技术方案,可以加强各种特征的融合效应。

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