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Ferroelectric random access memory sensing scheme

机译:铁电随机存取记忆感测方案

摘要

Semiconductor memory devices and methods of operating the same are provided. The method of operation may include the steps of selecting a ferroelectric memory cell for a read operation, coupling a first pulse signal to interrogate the selected ferroelectric memory cell, the selected ferroelectric memory cell outputting a memory signal to a bit-line in response to the first pulse signal, coupling the memory signal to a first input of a sense amplifier via the bit-line, electrically isolating the sense amplifier from the selected ferroelectric memory cell, and enabling the sense amplifier for sensing after the sense amplifier is electrically isolated from the selected ferroelectric memory cell. Other embodiments are also disclosed.
机译:提供了半导体存储器件和操作方法。操作方法可以包括选择用于读取操作的铁电存储器单元的步骤,耦合第一脉冲信号以询问所选择的铁电存储器单元,所选择的铁电存储器单元响应于响应的位线输出存储器信号。第一脉冲信号,通过位线将存储器信号耦合到读出放大器的第一输入,从所选铁电存储器单元电隔离读出放大器,并使读出放大器与读出放大器电隔离后进行感测的读出放大器。选择的铁电存储器电池。还公开了其他实施例。

著录项

  • 公开/公告号US10978127B2

    专利类型

  • 公开/公告日2021-04-13

    原文格式PDF

  • 申请/专利权人 CYPRESS SEMICONDUCTOR CORPORATION;

    申请/专利号US202016784712

  • 发明设计人 ALAN D. DEVILBISS;JONATHAN LACHMAN;

    申请日2020-02-07

  • 分类号G11C11/22;G11C7/06;G11C7/08;

  • 国家 US

  • 入库时间 2022-08-24 18:10:50

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