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Systems and methods for forming finFET analog designs having a modular memory-like layout

机译:用于形成具有模块化内存类似布局的FinFET模拟设计的系统和方法

摘要

A method of forming a finFET includes providing a semiconductor substrate having at least one fin feature extending through a diffusion layer formed on the semiconductor substrate, forming a gate layer on the diffusion layer and the fin feature, splitting the gate layer into a split gate structure including a first gate region, a second gate region, and a gap separating the first gate region and the second gate region, doping the gate layer, doping the diffusion layer to form a plurality of source/drain regions that includes a source/drain region in the gap between the first gate region and the second gate region, and injecting dopants into the diffusion layer to form a diffusion region having a plurality of pocket dopant regions. The plurality of pocket dopant regions includes at least one pocket dopant region in the gap between the first gate region and the second gate region.
机译:形成FINFET的方法包括提供具有至少一个延伸穿过形成在半导体衬底上的漫射层的翅片特征的半导体衬底,在扩散层和翅片特征上形成栅极层,将栅极层分成分开的栅极结构包括第一栅极区域,第二栅极区域和分离第一栅极区域和第二栅极区域的间隙,掺杂栅极层,掺杂漫射层以形成包括源/漏区的多个源/漏区在第一栅极区域和第二栅极区域之间的间隙中,并将掺杂剂注入扩散层以形成具有多个袋掺杂区域的扩散区域。多个袋掺杂区域包括在第一栅极区域和第二栅极区域之间的间隙中的至少一个袋掺杂剂区域。

著录项

  • 公开/公告号US10978592B1

    专利类型

  • 公开/公告日2021-04-13

    原文格式PDF

  • 申请/专利权人 MARVELL ASIA PTE. LTD.;

    申请/专利号US202016741311

  • 发明设计人 HUI WANG;RUNZI CHANG;

    申请日2020-01-13

  • 分类号H01L21/336;H01L29/78;H01L21/8234;H01L27/088;H01L29/66;H01L29/10;

  • 国家 US

  • 入库时间 2022-08-24 18:10:46

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