Wall thickness measuring device and wall thickness measuring method using this

摘要

PROBLEM TO BE SOLVED: To provide a wall thickness measuring device capable of easily and highly accurately measuring the wall thickness of a predetermined portion of an inspection object, and a wall thickness measuring method using the same. An inspection unit 100s has a first thick portion 101a facing an X-ray irradiation device 2 and a second thick portion 101a facing the first thick portion 101a on an X-ray irradiation axis A at intervals. The shielding member 4 has a thick portion 101b and is arranged on a surface of the first thick portion 101a facing the X-ray irradiation device 2, and blocks the second rearward scattered X-rays generated in the second thick portion 101b. Then, the X-ray detection device 3 detects the back-scattered X-rays including the first back-scattered X-rays 11 generated in the first thick portion 101a, and measures the X-ray dose and the amount of energy thereof. , The wall thickness of the first wall thickness portion 101a is obtained based on the X-ray dose at a specific energy of the detected backward scattered X-rays. [Selection diagram] Fig. 1