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Systems and Methods of Use for Introducing Particle-Containing Samples to Analytical Instruments
Systems and Methods of Use for Introducing Particle-Containing Samples to Analytical Instruments
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机译:用于将含颗粒样品引入分析仪器的系统和使用方法
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摘要
Systems and methods used to introduce samples into an analytical instrument are disclosed. The systems and methods are suitable for processing liquid samples or gaseous samples, including samples containing particulate contaminants, for subsequent analysis using analytical instruments such as, for example, mass spectrometers and/or inductively coupled plasma mass spectrometers.
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