Methods and systems to verify correctness of bug fixes in integrated circuits

摘要

A method and/or system is disclosed for pre-silicon verification of a first integrated circuit design modified to a second integrated circuit design to avoid a hit of property P where property P has a known counterexample. The method/system includes applying a first implication check in an equivalence testbench on the first integrated circuit and on the second integrated circuit to determine whether the second integrated circuit hits property P in the same way as the first integrated circuit hits property P. Additionally or alternatively applying a second implication check to determine whether the second integrated circuit hits property P at a different timestep than the first integrated circuit hits property P. Additionally or alternatively applying a third implication check to determine whether the second integrated circuit hits property P further along a path than the first integrated circuit hits property P.