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METHOD FOR MANUFACTURING A SEMICONDUCTOR PACKAGE AND METHOD FOR TESTING BONDING STRENGTH OF COMPOSITE SPECIMEN

机译:制造半导体封装的方法及其测试复合标本的粘合强度的方法

摘要

A method for manufacturing a semiconductor package includes the following steps. A semiconductor process is performed to form an encapsulated semiconductor device, wherein the encapsulated semiconductor device comprises an encapsulating material and a semiconductor device encapsulated by the encapsulating material. A testing apparatus including a holder body, a positioning mechanism and a force applying bar is provided. The encapsulated semiconductor device is clamed by the holder body. A clamping position of the encapsulated semiconductor device is adjusted by the positioning mechanism. The positioning mechanism is removed. A predetermined force is applied to a part of the encapsulated semiconductor device exposed by the holder body by the force applying bar. If the encapsulated semiconductor device is failed by the predetermined force, a process parameter of the semiconductor process is modified to form a modified encapsulated semiconductor device.
机译:用于制造半导体封装的方法包括以下步骤。执行半导体处理以形成封装的半导体器件,其中封装的半导体器件包括封装材料和由封装材料封装的半导体器件。提供包括支架主体,定位机构和力施加杆的测试装置。封装的半导体器件被支架主体克切。通过定位机构调节封装的半导体器件的夹紧位置。去除定位机构。通过施加杆将预定力施加到由支架主体暴露的封装半导体器件的一部分。如果封装的半导体器件通过预定力发生故障,则修改半导体处理的过程参数以形成修改的封装半导体器件。

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