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PULSED HIGH CURRENT TECHNIQUE FOR CHARACTERIZATION OF DEVICE UNDER TEST
PULSED HIGH CURRENT TECHNIQUE FOR CHARACTERIZATION OF DEVICE UNDER TEST
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机译:脉冲高电流技术,用于表征耐压器件
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摘要
A test and measurement circuit including a capacitor in parallel with a device under test, a direct current voltage source configured to charge the capacitor, a pulse generator configured to generate a pulse for testing the device under test, and a sensor for determining a current in the device under test.
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