首页> 外国专利> method and system for predicting pass rate of making question

method and system for predicting pass rate of making question

机译:预测问题的方法和系统

摘要

In order to stabilize the passing rate for each year of the exam so that the public confidence of the exams to be questioned is improved, the present invention provides test scoring data for each past year and mock exam scoring data for each past year, including average score data of each of the previously implemented exams and mock exams, A first step of inputting and storing the simulation test scoring data for the current year and the test difficulty adjustment details data for each previous year into a database unit; A second step of extracting and calculating the test scoring data for each past year, the mock test scoring data for each past year and the current year, and the test difficulty adjustment details data for each past year, stored in the database unit, by a plan calculation unit to calculate a learning index for each past year; A third step of calculating the learning index for the current year through the plan calculation unit based on the learning index for each past year and the previously stored data on the number of test takers for each past year; And the current year's learning index, the previous year's test average score data, the previous year's simulation test average score data, the current year's simulation test average score data, and the current year's test difficulty adjustment history data calculated through the plan calculation unit. It provides a test pass rate prediction method including a fourth step of calculating the expected average score data for the current year for determining the pass rate and managing the difficulty of the test.
机译:为了稳定每年考试的传递率,以便提高考试的公众信心,本发明为每年过去一年的考试评分数据提供了测试评分数据,包括平均值分数数据每个先前实现的考试和模拟考试,这是输入和存储当前年份的模拟测试评分数据的第一步,以及测试难度将每年的测试难度调整到数据库单元中;在过去一年中提取和计算测试评分数据的第二步,每个过去一年和当年的模拟测试评分数据以及过去一年的测试难度调整细节数据,由a储存在数据库单元中计划计算单元计算过去一年的学习指数;基于每年过去一年的学习索引计算当年学习指数的第三步,并以前一年的学习索引以及以前存储的数据过去一年的考试人员数量;而当年的学习指数,前一年的考试平均分数数据,上一年的仿真试验平均分数数据,当年的仿真试验平均分数数据,以及当前的测试难度调整历史数据通过计划计算单元计算历史数据。它提供了一种测试通行率预测方法,包括计算当前年度的预期平均分数数据的第四步,以确定通过率并管理测试难度。

著录项

  • 公开/公告号KR102222026B1

    专利类型

  • 公开/公告日2021-03-03

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020190036437

  • 发明设计人 김재해;박칠규;송동건;

    申请日2019-03-29

  • 分类号G06Q50/20;G06Q10/04;G06Q10/06;

  • 国家 KR

  • 入库时间 2024-06-14 21:20:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号