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method and system for predicting pass rate of making question

机译:提问合格率的预测方法及系统

摘要

In order to stabilize the passing rate for each year of the exam so that the public confidence of the exam to be questioned is improved, the present invention provides test scoring data for each past year and mock exam scoring data for each past year, including average score data of each previously implemented exam and mock exam, A first step of inputting and storing the simulation test scoring data for the current year and the test difficulty adjustment details data for each previous year in the database; A second step of extracting and calculating the test scoring data for each past year, the mock test scoring data for each past year and the current year, and the test difficulty adjustment details data for each past year, stored in the database unit, by a plan calculation unit to calculate a learning index for each past year; A third step of calculating a learning index for the current year through the plan calculation unit based on the learning index for each past year and the previously stored data on the number of test takers for each past year; And the current year's learning index, the previous year's test average score data, the previous year's simulation test average score data, the current year's simulation test average score data, and the current year's test difficulty adjustment history data calculated through the plan calculation unit. It provides a test pass rate prediction method including a fourth step of calculating the expected average score data for the current year for determining the pass rate and managing test difficulty.
机译:为了使每一年的考试通过率稳定,以提高被质疑考试的公众信心,本发明提供了过去一年的考试成绩数据和过去一年的模拟考试成绩数据,包括平均值将先前实施的每项考试和模拟考试的分数数据;第一步,输入并存储当年的模拟考试成绩数据和上一年度的考试难度调整详细数据,并将其存储在数据库中;第二步是通过以下方式提取并计算存储在数据库单元中的过去一年的考试分数数据,过去一年和当前年份的模拟考试分数数据以及过去一年的考试难度调整详细数据。计划计算单元,计算过去一年的学习指数;第三步,通过计划计算单元,根据过去一年的学习指数和先前存储的过去一年的应试人数,计算出当年的学习指数;并且通过计划计算单元计算出的当年学习指数,上一年的考试平均成绩数据,上一年的模拟考试平均成绩数据,当年的模拟考试平均成绩数据以及当年的考试难度调整历史数据。它提供了一种测试合格率预测方法,该方法包括第四步:计算当年的预期平均分数数据,以确定合格率并管理测试难度。

著录项

  • 公开/公告号KR20200114519A

    专利类型

  • 公开/公告日2020-10-07

    原文格式PDF

  • 申请/专利权人 한국산업인력공단;

    申请/专利号KR20190036437

  • 发明设计人 김재해;박칠규;송동건;

    申请日2019-03-29

  • 分类号G06Q50/20;G06Q10/04;G06Q10/06;

  • 国家 KR

  • 入库时间 2022-08-21 11:05:54

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