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LOW-LEAKAGE REGROWN GAN P-N JUNCTIONS FOR GAN POWER DEVICES

机译:用于GaN电源装置的低泄漏再生GaN P-N结

摘要

Fabricating a regrown GaN p-n junction includes depositing a n-GaN layer on a substrate including n+-GaN, etching a surface of the n-GaN layer to yield an etched surface, depositing a p-GaN layer on the etched surface, etching a portion of the n-GaN layer and a portion of the p-GaN layer to yield a mesa opposite the substrate, and passivating a portion of the p-GaN layer around an edge of the mesa. The regrown GaN p-n junction is defined at an interface between the n-GaN layer and the p-GaN layer. The regrown GaN p-n junction includes a substrate, a n-GaN layer on the substrate having an etched surface, a p-GaN layer on the etched surface, a mesa defined by an etched portion of the n-GaN layer and an etched portion of the p-GaN layer, and a passivated portion of the p-GaN layer around an edge of the mesa.
机译:制造再生GaN PN结包括在包括n + -gan的基板上沉积n-gaN层,蚀刻n-gaN层的表面,得到蚀刻表面,沉积p-ga1层在蚀刻表面上,蚀刻N-GaN层的一部分和P-GaN层的一部分,以产生与基板相对的台面,并钝化P-GaN层的一部分围绕台面的边缘。再生GaN P-N结在N-GaN层和P-GaN层之间的界面处定义。 GaN PN结包括基板,在基板上具有蚀刻表面的N-GaN层,蚀刻表面上的P-GaN层,由N-Ga1层的蚀刻部分限定的台面和蚀刻部分P-GaN层和围绕台面边缘的P-GaN层的钝化部分。

著录项

  • 公开/公告号US2021104603A1

    专利类型

  • 公开/公告日2021-04-08

    原文格式PDF

  • 申请/专利权人 YUJI ZHAO;KAI FU;HOUQIANG FU;

    申请/专利号US202017031342

  • 发明设计人 YUJI ZHAO;KAI FU;HOUQIANG FU;

    申请日2020-09-24

  • 分类号H01L29/06;H01L21/30;H01L21/02;H01L21/306;H01L21/324;H01L29/20;H01L29/872;H01L29/735;H01L29/808;

  • 国家 US

  • 入库时间 2022-08-24 17:23:54

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