首页> 外国专利> Improvements in and relating to precision linear-dimension measuring instruments

Improvements in and relating to precision linear-dimension measuring instruments

机译:精密线性尺寸测量仪及其相关的改进

摘要

577,231. Linear - dimension gauges. KILISZEK, S. R. March 21, 1944, No. 5252. [Class 106 (ii)] In a comparator wherein slip gauges: are used to set the instrument to a measurement in near relation to the one required, after which precise adjustment is made, the supplementary adjustment is provided by the engagement of a uniformly tapered portion 24 of a rotatable, threaded spindle 22, movable axially by means of a micrometer 20 or equivalent device, the tapered portion 24 coacting with the head of a plunger 32 forming or supporting the contacting or indicating member 39 of the instrument. A drawer 44 is provided for the storage of slip gauges.
机译:577,231。线性-尺寸规。 SR,KILISZEK,1944年3月21日,编号5252。[Class 106(ii)]在一种比较器中,使用滑尺:用于将仪器设置为与所需的测量值接近的测量值,然后进行精确调整,通过可旋转的,带螺纹的心轴22的均匀锥形部分24的接合来提供补充调节,该锥形部分24可通过千分尺20或等效装置轴向移动,锥形部分24与形成或支撑柱塞32的头部配合。接触或指示仪器的构件39。提供了一个抽屉44,用于存放滑动规。

著录项

  • 公开/公告号GB577231A

    专利类型

  • 公开/公告日1946-05-09

    原文格式PDF

  • 申请/专利权人 STANISLAW RICHARD KILISZEK;

    申请/专利号GB19440005252

  • 发明设计人

    申请日1944-03-21

  • 分类号G01B5/06;

  • 国家 GB

  • 入库时间 2022-08-24 03:03:39

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号