In order to investigate the interference microscope surface quality is solid body

• 1. 一种固体废物堆存场所的精准调查方法 [P] . 中国专利： CN110045436A . 2019-07-23
• 2. 收视率调查设备和使用收视率调查设备的收视率调查系统 [P] . 中国专利： CN109644295A . 2019-04-16
• 3. In order to investigate the interference microscope surface quality is solid body. [P] . 德国专利： DE1648225U . 1952-12-18

  机译： 为了调查干涉显微镜的表面质量是固体。

• 4. Electron microscope for investigation of surfaces of solid bodies [P] . 英国专利： GB2230643B . 1993-10-27

  机译： 电子显微镜，用于研究固体表面

• 5. Electron microscope for investigation of surfaces of solid bodies [P] . 美国专利： US4978855A . 1990-12-18

  机译： 电子显微镜，用于研究固体表面

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