首页> 外国专利> Device for measuring the thickness or the weight of a helicoidal guide band - or tabular product being measured by means of radioactive or several times and of a comparison with normal x-rays

Device for measuring the thickness or the weight of a helicoidal guide band - or tabular product being measured by means of radioactive or several times and of a comparison with normal x-rays

机译：用于测量螺旋形导带或平板状产品的厚度或重量的装置，该装置通过放射性或多次方式进行测量并与正常的x射线进行比较

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公开/公告号DE1053793B

专利类型
公开/公告日1959-03-26

原文格式PDF
申请/专利权人 SIEMENS AG;
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申请/专利号DE1954S041210
发明设计人 WILIMZIG HERBERT;ENGL DR WALTER;HORN DIPL-ING KLAUS;
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申请日1954-10-13
分类号G01G9;G01N23/16;
国家 DE
入库时间 2022-08-23 20:01:07

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