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X-ray apparatus for determination of internal stresses in materials
X-ray apparatus for determination of internal stresses in materials
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机译:用于确定材料内部应力的X射线设备
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911,201. Stress measurements. KHOL, F. Jan. 23, 1959 [Jan. 25, 1958], No. 2590/59. Addition to 881,234. Class 98 (1). An X-ray apparatus for measurement of internal stresses in materials comprises two X- ray tubes for simultaneous irradiation of the specimen under examination, two corresponding detectors located on the same focal circle as the X-ray tubes, the detectors and the X-ray tubes subtending equal angles at the specimen. In the form shown, the apparatus is mounted on a sector-shaped plate K which pivots about its centre O 4 which is also the centre of the focal circle F. The detectors D 1 , D 2 are pivoted on pins O 1 , O 2 mounted on plate K, and arms r 1 , r 2 , pivoted at a point O 3 , are slidably connected with the detectors. The angle they subtend at the specimen is # 0 , which in the example shown is 45 degrees. The plate K is rotated by motor M in synchronization with recording apparatus, which records in the form of a graph (Fig. 3, not shown) the intensity of the interference received simultaneously by the detectors as a function of their angular positions. By measurements made on the displacement between the maxima of diffracted radiation from the specimen obtained by the two detectors, the internal stress can be calculated from a given formula.
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