A method and device for the measurement of thickness and refractive index thinner, weakly absorbing layers

• 1. 一种精准测量弱刚性薄形零件厚度的装置及方法 [P] . 中国专利： CN112113527B . 2021.07.13
• 2. 一种精准测量弱刚性薄形零件厚度的装置及方法 [P] . 中国专利： CN112113527A . 2020-12-22
• 3. method and device for measuring thickness and refractive index duenner, weak absorbent layers [P] . 德国专利： DE000001147406A . 1963-04-18

  机译： 薄的吸收层的厚度和折射率的测量方法和装置

• 4. DEVICE AND A METHOD FOR MEASURING A MULTI-LAYERED THIN FILM, CAPABLE OF MEASURING INNER IMAGES, REFLECTIVITY, TRANSMITTANCE, REFRACTIVE INDEX, AND A THICKNESS OF A MEASUREMENT OBJECT IN NON-DESTRUCTIVE METHOD [P] . 韩国专利： KR20120081419A . 2012-07-19

  机译： 用于测量多层薄膜的设备和方法，其能够以非破坏性方法测量内部图像，反射率，透射率，折光率和测量对象的厚度

• 5. Method and apparatus for electronic measurement of the thickness of very thinner electrically conductive layers on non-conducting substrate [P] . 德国专利： DE3107675A1 . 1982-09-23

  机译： 电子测量非导电基板上非常薄的导电层厚度的方法和设备

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