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A method of and apparatus for assessing the quantity of inclusions of foreign material in solid specimens

机译:评估固体样品中异物夹杂物数量的方法和设备

摘要

1,046,443. Local viewing systems using scanning. T.I. (GROUP SERVICES) Ltd. April 23, 1963 [April 24, 1962], No. 15481/62. Heading H4F. [Also in Divisions G1 and G4] To assess the quantity of inclusions of foreign material in a solid specimen, a beam of electrons is generated and focused on to the surface of the specimen and caused to scan the surface, and an electrical signal is produced in response to the back scatter of electrons from the surface as the surface is scanned. In addition or alternatively an electrical signal or signals is or are produced by an X-ray spectrometer responsive to X-rays produced when the beam strikes the specimen and an output signal is produced which is a measure of the quantity of inclusions of foreign material in the area scanned by the beam. As shown in Fig. 1 a beam of electrons 3 from a gun 1 and an electromagnetic condenser lens 2, is focused by a lens 4 on to the flat surface of one of a number of specimens 5 supported on a rotatable table 7, and scans a region on the specimen under the action of scanning coils 6. Back scatter from the surface is detected by a scintillation counter and photomultiplier 8 and X-rays of different wavelengths are detected by a number of X-ray spectrometers 9 of the crystal type each producing an electrical pulse as the beam passes over an inclusion containing an element of which the characteristic wavelength is that to which that particular spectrometer is adjusted. A corresponding pulse is produced by the scintillation counter and photomultiplier 8 as an inclusion or a hole in the surface is scanned. Simultaneous pulses produced by combinations of the X-ray spectrometers are used to identify the composition of the inclusion causing the X-ray emission. When steel is examined, a pulse received from the scintillator alone without any corresponding simultaneous signal from any of the spectrometers indicates either the presence of ferrous oxide or a hole and not an inclusion. In the arrangement shown in Fig. 2 a pre-recorded sine wave signal on a track D1 of a magnetic drum store D rotated at constant speed by a motor M is picked up by a head H, amplified and used to generate a saw-tooth signal which controls the line scanning coils L for the electron beam. The saw-tooth signal is differentiated to produce a pulse at the end of each revolution of the drum D and these pulses actuate a monostable multivibrator MV of which the output is integrated to form a signal increasing stepwise to feed the frame scanning coils. These pulses are also counted by a counter and after 300 pulses the stepwise signal is returned to zero and the motor M driving the drum is switched off and in addition an electric motor (not shown) is switched on to turn the table 7 bringing another specimen under the path of the beam. The pulses from the scintillator 8 are fed to a pair of pulse height discriminators T in the form of Schmitt trigger circuits set respectively to different levels to provide the necessary discrimination between for example sulphides and silicates when steel is examined. The outputs of the trigger circuits together with the outputs from the X-ray spectrometers which are fed through pulse-shaping Schmitt triggers (not shown) are fed to a known logic circuit system E which includes coincidence circuits to determine from the combination of signals from the spectrometers what the composition of the inclusions is, and it has seven output channels the output signals of each being in the form of pulses, each pulse occurring when the beam passes over an inclusion of the kind associated with that output channel. The length of each pulse is dependent on the width of the inclusion in the direction of the scanning lines. The outputs are fed through a multi-pole multi-way selector switch S to an analysis circuit A which utilizes further tracks on the drum D to (1) count the total number of inclusions present in the scanned area, (2) count the number of inclusions in each of a number of size ranges by means of pulse height discriminators, (3) count the number of inclusions greater than a certain size, (4) count the number of inclusions (also, if required, by size) of a selected composition, (5) obtain an indication of the average size of inclusion of a given type or any type, (6) determine roughly the shape of inclusion by measuring their aspect ratio. The circuit can alternatively indicate the total quantity of inclusions present as a percentage of the total area scanned. The magnetic drum may be replaced by an electromechanical or electronic delay line or an endless loop of magnetic tape. The circuit A may include binary stores so tha t at the end of a scanning operation the informat ion stored may be read out sequentially by means of a multiway switch so that it can be viewed on an illuminated display or printed out on paper tape P. In addition, a monitoring cathode-ray tube screen CR carrying a raster representing the area scanned may be provided, the brightness of the spot being controlled selectively by any of the signals from the circuit A, so that it may display the distribution of inclusions of any selected type or size. The information produced by the circuit A may be shown in other manners such as on magnetic tape, punched cards or on punched tape for analysis in further machines or displayed as histograms on cathode-ray tubes.
机译:1,046,443。使用扫描的本地查看系统。 T.I. (GROUP SERVICES)Ltd. 1963年4月23日[1962年4月24日],编号15481/62。标题H4F。 [也用于G1和G4分区]为了评估固体样品中杂质的夹杂物数量,产生了一个电子束,并将其聚焦在样品表面上,并使其扫描表面,并产生电信号。响应于扫描表面时电子从表面向后散射。附加地或替代地,X射线光谱仪响应于当光束撞击样本时产生的X射线而产生一个或多个电信号,或者产生输出信号,该信号是对杂质的夹杂物量的度量。光束扫描的区域。如图1所示,来自电子枪1和电磁聚光透镜2的电子束3被透镜4聚焦到支撑在可旋转台7上的多个样品5之一的平坦表面上,并进行扫描。样品在扫描线圈6的作用下的一个区域。通过闪烁计数器检测从表面的反向散射,并通过多个晶体类型的X射线光谱仪9检测光电倍增管8和不同波长的X射线。当光束经过包含物的夹杂物时产生电脉冲,包含物的特征波长是特定光谱仪所调节的波长。当扫描表面上的夹杂物或孔时,由闪烁计数器和光电倍增器8产生相应的脉冲。由X射线光谱仪组合产生的同时脉冲用于识别引起X射线发射的夹杂物的成分。在检查钢时,仅从闪烁器接收到的脉冲而没有来自任何光谱仪的任何相应同时信号,则表明存在氧化亚铁或存在孔而没有夹杂物。在图2所示的布置中,由电动机M以恒定速度旋转的磁鼓存储器D的轨道D1上的预记录正弦波信号被磁头H拾取,放大并用于产生锯齿信号控制电子束的线扫描线圈L。锯齿信号微分以在滚筒D的每转结束时产生一个脉冲,这些脉冲驱动单稳态多谐振荡器MV,其输出被积分以形成逐步增加的信号以馈入帧扫描线圈。这些脉冲也由计数器计数,并且在300个脉冲之后,逐步信号返回到零,并且驱动鼓的电动机M被关闭,并且此外,电动机(未示出)被接通以打开工作台7,从而带来另一个样本在光束的路径下。来自闪烁体8的脉冲以施密特触发器电路的形式被馈送到一对脉冲高度鉴别器T,施密特触发电路分别设置为不同的电平,以在检查钢时提供例如硫化物和硅酸盐之间的必要区分。触发电路的输出与X射线光谱仪的输出通过脉冲成形施密特触发器(未显示)一起馈入已知的逻辑电路系统E,该系统包括符合电路,用于根据来自信号的组合确定光谱仪测量夹杂物的成分,它具有七个输出通道,每个输出通道的输出信号均为脉冲形式,每个脉冲在光束经过与该输出通道相关的夹杂物时出现。每个脉冲的长度取决于扫描线方向上夹杂物的宽度。输出通过多极多路选择器开关S馈送至分析电路A,该分析电路利用感光鼓D上的其他迹线进行以下操作:(1)计算扫描区域中夹杂物的总数,(2)计算数量通过脉冲高度鉴别器在多个尺寸范围中的每个范围内对夹杂物的数量进行统计,(3)计算大于某个尺寸的夹杂物的数量,(4)计算一个容器中的夹杂物的数量(如果需要,还按尺寸)选定的成分,(5)获得给定类型或任何类型的夹杂物平均尺寸的指示,(6)通过测量其长宽比大致确定夹杂物的形状。电路可替代地指示所包含的夹杂物总量占所扫描总面积的百分比。可以用机电或电子延迟线或磁带的环形环代替磁鼓。电路A可以包含二进制存储,因此在扫描操作结束时,可以通过多路开关顺序读取存储的信息,以便可以在照明显示器上查看或打印在纸带P上。另外,可以提供带有代表扫描区域的光栅的监视阴极射线管屏幕CR,斑点的亮度由来自电路A的任何信号选择性地控制,从而斑点可以显示任何选定类型或尺寸的夹杂物的分布。电路A产生的信息可以以其他方式示出,例如在磁带,打孔卡上或在打孔带上,以便在其他机器中进行分析,或者以直方图形式显示在阴极射线管上。

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