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The method of forming a short circuit between the emitter zone and the adjacent zone of the opposite conductivity type of a controllable silicon equal to richter element

机译:在可控硅的相反导电类型等于更富元素的发射极区和相邻区之间形成短路的方法

摘要

975,990. Semi-conductor devices. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. July 29, 1963 [Aug. 15, 1962], No. 31324/62. Heading H1K. A short-circuit between the emitter region 4 of a silicon controlled-rectifier element 1 and the adjacent region of opposite conductivity type is formed by depositing gold in finelydivided form (preferably by evaporation) on to a surface of the element 1 in vacuo to form a layer 8 in contact with both the regions after the element 1 has been heated to a temperature at which the gold forms a eutectic with the silicon, and then cooling the element sufficiently quickly for the gold to solidify before impurity activating material present in the emitter region 4 enters into the gold.
机译:975,990。半导体器件。联合电气工业有限公司。1963年7月29日[八月。 [1962年1月15日],第31324/62号。标题H1K。硅可控整流器元件1的发射极区域4和相反导电类型的相邻区域之间的短路是通过将细分散形式的金(优选通过蒸发)在真空中沉积到元件1的表面上以形成的而形成的。在将元素1加热到金与硅形成共晶的温度之后,使层8与两个区域接触,然后在元素中的杂质活化材料存在之前,将元素冷却得足够快,以使金固化区域4进入黄金。

著录项

  • 公开/公告号DE1235434B

    专利类型

  • 公开/公告日1967-03-02

    原文格式PDF

  • 申请/专利权人 ASS ELECT IND;

    申请/专利号DE1963A043820

  • 发明设计人 SADLER ALBERT JOHN;

    申请日1963-08-14

  • 分类号H01L23/482;H01L29/00;

  • 国家 DE

  • 入库时间 2022-08-23 14:11:51

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