Device for the structural study of materials by means of electron beams

摘要

1,058,158. Electron microscopes. PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd. Aug. 25, 1964 [Aug. 28, 1963], No. 34703/64. Heading H1D. A specimen holder 50 for an electron microscope is rotatable about an axis at right angles to the plane of the specimen by means of an operating member 42 provided on the support outside the housing of the microscope. On rotating the knob 42 and threaded spindle 34, the sliding piece 31 is displaced, thus causing the cord 44, 53, 54 to rotate the specimen holder 50. The specimen support is also capable of rotation about its own axis, and the holder is held in a tube attached to a supporting ring located inside the body of the microscope, the ring being capable of movement in a plane transverse to the axis of the microscope.