method and device for thickness measurement of arbitrary profiles

• 1. 一种测量自由曲面任意点厚度的装置及其测量方法 [P] . 中国专利： CN111174739A . 2020-05-19
• 2. 利用二维反射计测量多层薄膜的厚度轮廓和折射率分布的装置及其测量方法 [P] . 中国专利： CN1556914A . 2004-12-22
• 3. method and device for thickness measurement of arbitrary profiles [P] . 德国专利： DE000001095526A . 1960-12-22

  机译： 任意轮廓的厚度测量方法和装置

• 4. method for controlling thickness of the extrusion (manufacture), long articles made of thermoplastic materials, such as films, tubes, pipes, cable sheathing, plates, profiles and measurements and device for extruder, extruding od. etc. for elongated objects [P] . 德国专利： DE3311345C2 . 1986-02-20

  机译： 用于控制挤出（制造）厚度的方法，由热塑性材料制成的长型制品，例如薄膜，管，管，电缆护套，板，型材和尺寸以及挤出机，挤出装置。等用于细长物体

• 5. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements [P] . 美国专利： US8810784B2 . 2014-08-19

  机译： 使用单点厚度和折射率测量确定眼镜片厚度轮廓的方法和设备

• 1. A New Method for Measurements of the Poloidal Rotation Velocities and Wavelength Calibration of X-ray Imaging Crystal Spectrometer in Magnetic Fusion Devices [J] . SHI Yuejiang, LYU Bo, WANG Fudi, 等离子体科学和技术（英文版） . 2015,第004期
• 2. AERODYNAMIC DESIGN METHOD OF CASCADE PROFILES BASED ON LOAD AND BLADE THICKNESS DISTRIBUTION [J] . 姚征, 刘高联 应用数学和力学（英文版） . 2003,第008期
• 3. Terahertz Bessel Beam Applied to Thickness Measurement of Ellipsometry Methods [J] . Siyu Tu, Kejia Wang, Jinsong Liu, 电脑和通信（英文） . 2021,第012期
• 4. A Novel Method for the Measurement of Dry Film Thickness on Profiled Steel Surfaces [C] . J Walker, JF Fletcher Corrosion conference and expo . 2015
• 5. In Situ, Through-Thickness Potential Distribution Measurements in Electrochemical Energy Conversion and Storage Devices [D] . Tully, Katherine C. 2013
• 6. Comparison of central corneal thickness measurements with three different optical devices [O] . Mehmet Barış Üçer, Erdinç Bozkurt 2021
• 7. "A High Speed Laser Profiling Device for Refractory Lininig Thickness Measurements In a Gasifier with Cross-Cut to the Metals, Forest Products, Chemical and Power Generation Industries" [O] . Bonin, Michel, Harvill, Tom, Hoog, Jared, 2007
• 8. Some remarks on an approximate method of estimating the wave drag due to thickness at supersonic speeds of three-dimensional wings with arbitrary profile [R] . Margolis, Kenneth 1952

• 1. CONTAMINATION LINE METHOD AND COMPARISON OF FOIL THICKNESS MEASUREMENT METHODS IN TRANSMISSION ELECTRON MICROSCOPY [J] . PAN ZhenpengGuangdong Mechanical College. Guangzhou. China . 金属学报：英文版 . 1994,第3期
• 2. Simulations of the Electron Spectrum of Quantum Wires in in/i-Si of Arbitrarily Doping Profile by Thomas-Fermi Method [J] . Volodymyr Grimalsky ,Svetlana Koshevaya ,Jesus Escobedo-Alatorre . 电磁分析与应用期刊（英文） . 2018,第8期
• 3. 基于速度场的直接驱动XY平台任意轨迹规划与精密轮廓控制 [C] . 王丽梅 . 第十二届设计与制造前沿国际会议（ICFDM2016） . 2016
• 4. 任意厚度充气圆管的局部起鼓——抗弯刚度的影响 [A] . 柳俊隆_ . 2016