Choosing a semiconductor chalcogenide glass - by differential thermal analysis and resistivity/temperature plots

摘要

An at least binary cpd. of As, Te or Ge is used together with variable addition of S, Se and/or Te as vitrifiers so that the amorphous state is detected using differential thermal analysis and resistivity measurements at various temps. The amount to be added for various purposes is selected from appropriate compsn. and temp curves for the appropriate property.