首页> 外国专利> MICROWAVE THICKNESS MEASURING DEVICE UTILIZING TWO RESONANT CAVITIES ON EITHER SIDE OF THE TEST PIECE

MICROWAVE THICKNESS MEASURING DEVICE UTILIZING TWO RESONANT CAVITIES ON EITHER SIDE OF THE TEST PIECE

机译:利用试件两侧的两个谐振腔的微波厚度测量装置

摘要

A device for measuring a displacement or the thickness of a sheet comprises a microwave test cavity resonator whose resonance frequency is controlled by said displacement or thickness and a microwave reference cavity resonator. A saw tooth modulated microwave generator supplies microwave energy to both cavities. First and second detector means detect the transmission of power by the test cavity and the reference cavity respectively and the volume and resonance frequency of the reference cavity are automatically adjusted in order to cause said transmissions to coincide in time.
机译:一种用于测量片材的位移或厚度的装置,包括:微波测试腔谐振器,其谐振频率由所述位移或厚度控制;以及微波参考腔谐振器。锯齿调制微波发生器向两个腔体提供微波能量。第一和第二检测器装置分别检测测试腔和参考腔的功率传输,并自动调节参考腔的体积和共振频率,以使所述传输在时间上一致。

著录项

  • 公开/公告号US3737770A

    专利类型

  • 公开/公告日1973-06-05

    原文格式PDF

  • 申请/专利权人 COMMISS A LENERGIEFR;

    申请/专利号USD3737770

  • 发明设计人 MASSON MFR;WARLOP RFR;

    申请日1970-11-27

  • 分类号G01R27/04;

  • 国家 US

  • 入库时间 2022-08-23 06:28:06

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