首页> 外国专利> Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum

Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum

机译:分析靠近固体表面的元素-通过将纯分子束引导到表面上并观察光谱

摘要

A pure molecular beam, pref. of helium atoms, is directed onto the surface of a solid and the light spectrum emitted by the varying elements is analysed on a monochrometer by comparison with spectra of known elements. The energy of the molecular beam varies from 0.1 to 1 electron-volt for elements on the surface, 1 to 25 electron-volts for elements near to the surface and over 25 electron-volts for heavier solids. It is possible to direct several beams onto the surface so that the elements at various points can be simultaneously and continuously analysed. By filtering the light emitted so that only that of a certain element is allowed through it is possible to obt. the concn. of that element over a swept area, and by bombarding one spot of the surface with the molecular beam a graph of concn. of element with depth from surface can be made. A thin transparent layer of a body can be observed from the side opposite that of impact of the beam. Used for surface analysis of metals and alloys and partic. for biological analysis e.g. cells and tissues. Pure molecular beams with neutral atoms is not repelled so closer beam can be maintained over longer distance. Neutral atoms of pure molecular beam are less harmful hence sample can be under higher pressures approx 10-3 torr, giving also longer analysing time as degassing occurs more slowly. The intensity of the light emission does not depend on the form of the surface.
机译:纯分子束,优选。氦原子被引导到固体表面上,并且通过与已知元素的光谱进行比较,在单色仪上分析各种元素发出的光谱。对于表面上的元素,分子束的能量在0.1到1电子伏特之间变化;对于靠近表面的元素,分子束的能量在1到25电子伏特之间变化;对于较重的固体,分子束的能量超过25电子伏特。可以将多个光束引导到表面上,以便可以同时连续地分析各个点上的元素。通过过滤发出的光,使得仅允许某个元素的光通过,这是可能的。该concn。在一个扫掠的区域上,通过用分子束轰击该表面的一个点,绘制浓度图。可以制作从表面到深度的元素。从光束撞击的相反侧可以看到薄薄的透明层。用于金属和合金及颗粒的表面分析。用于生物学分析,例如细胞和组织。具有中性原子的纯分子束不会被排斥,因此可以在更长的距离上保持更近的束。纯分子束的中性原子危害较小,因此样品可以在约10-3托的较高压力下使用,由于脱气速度较慢,因此分析时间也更长。发光强度不取决于表面的形式。

著录项

  • 公开/公告号FR2257084A1

    专利类型

  • 公开/公告日1975-08-01

    原文格式PDF

  • 申请/专利权人 ANVARFR;

    申请/专利号FR19740000388

  • 发明设计人

    申请日1974-01-07

  • 分类号G01N23/22;G01J3/00;

  • 国家 FR

  • 入库时间 2022-08-23 03:44:46

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