Test apparatus for bipolar and FET's - has polarity reversing switch and switching elements to reverse transistors

摘要

Two contacts (17, 18) located in separate pushbuttons and in the form of an AND gate are used to connect a high ohmic resistance (13) for increasing the sensitivity of deflection of the indicator (24) to the output circuit (16) of the test piece. The switching elements forming the defined d.c. source and the defined ac. voltage source have assigned to them reversing elements located together in a separate pushbutton. In order to test the control effect of the test piece, these reversing elements reverse the switching elements to the supply of a direct current or an A.C. voltage of half the value.