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Junction diode with linear response to nuclear radiation - using silicon substrate with doped epitaxial coatings of silicon

机译:对核辐射具有线性响应的结型二极管-使用硅衬底以及掺杂的硅外延涂层

摘要

Mfr. of a semiconductor diode starting from a semiconductor crystal and contg. three distinct regions obtd. by depositing a first semiconducting layer (1) with one type of conductivity, then an intermediate intrinsic layer (2) followed by a third semiconducting layer (3) with opposite conductivity to layer (1). The novelty is that layers (1,3) are each preceded by a doping operation, using at =1 impurity which provisionally confers the opposite type of conductivity so that provided by the layers (1, 3). The substrate is pref. Si, the layers being obtd. by epitaxy in the vapour phase, and the impurities by diffusion or ion implantation. Layer (2) is formed by the substrate. The process is used for mfg. junction detector diodes for appts. analysing and measuring nuclear radiation. Linear response to radiation.
机译:制造商从半导体晶体开始的半导体二极管的结构和续。三个不同的区域。通过沉积具有一种类型的导电性的第一半导体层(1),然后沉积中间本征层(2),然后沉积具有与层(1)相反的导电性的第三半导体层(3)。新颖之处在于,层(1,3)之前均进行掺杂操作,使用> = 1的杂质,这些杂质暂时赋予相反类型的导电性,从而由层(1、3)提供。基材是优选的。 Si,各层都过钝。通过气相的外延生长,以及通过扩散或离子注入的杂质。层(2)由基板形成。该过程用于制造。用于器件的结检测二极管。分析和测量核辐射。对辐射的线性响应。

著录项

  • 公开/公告号FR2301927A1

    专利类型

  • 公开/公告日1976-09-17

    原文格式PDF

  • 申请/专利权人 RADIOTECHNIQUE COMPELEC;

    申请/专利号FR19750005674

  • 发明设计人 JEAN-LOUIS DIGOY;

    申请日1975-02-24

  • 分类号H01L31/18;G01T1/24;

  • 国家 FR

  • 入库时间 2022-08-23 01:47:11

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