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Measurement apparatus influenced by disturbing ambient temperature fluctuations

机译:测量设备受到环境温度波动的干扰

摘要

A measurement apparatus influenced by disturbing ambient temperature variations or fluctuations, said measurement apparatus having a limited volume filled with a medium subjected to such temperature fluctuations. Further, there is provided a compensation element which, under the influence of such disturbing temperature fluctuations, alters the size of a compartment which also contains the medium and thus also alters the aforementioned volume. The dimensions and the coefficient of thermal expansion of the compensation element, while taking into account the coefficient of thermal expansion and the quantity of medium contained in such compartment, are chosen such that the influence of the disturbing temperature fluctuations on the apparatus is compensated.
机译:受干扰的环境温度变化或波动影响的测量设备,所述测量设备具有有限的体积,该体积充满经受这种温度波动的介质。此外,提供了一种补偿元件,该补偿元件在这种令人不安的温度波动的影响下,改变了也包含介质的隔室的尺寸,并因此也改变了上述体积。选择补偿元件的尺寸和热膨胀系数,同时考虑到热膨胀系数和容纳在该隔室中的介质的量,从而补偿干扰的温度波动对设备的影响。

著录项

  • 公开/公告号US3934479A

    专利类型

  • 公开/公告日1976-01-27

    原文格式PDF

  • 申请/专利权人 HAENNI & CIE AKTIENGESELLSCHAFT;

    申请/专利号US19730421272

  • 发明设计人 MARIO POSNANSKY;

    申请日1973-12-03

  • 分类号G01K5/36;

  • 国家 US

  • 入库时间 2022-08-23 01:36:41

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