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Detector for heavy ions following mass analysis

机译:质量分析后的重离子检测器

摘要

A hot surface detector for heavy ions following their separation on the basis of charge-to-mass ratio. Upon striking the hot surface, the heavy ions decompose and give up their lighter constituent and/or impurity atoms and molecules to the surface. Those constituent and/or impurity atoms and molecules with ionization potentials or electron affinities comparable to the work function of the hot surface become surface ionized and are emitted from the surface as a burst of either positive or negative ions which are then detected by conventional means, including detection at an electrode, by an electron multiplier or by a mass spectrometric detector for light ions. Where negative ions are to be detected, a magnetic field is applied to prevent electrons from the hot surface from reaching the detector.
机译:根据电荷质量比分离重离子后的热表面探测器。撞击热表面后,重离子分解并向表面释放其较轻的成分和/或杂质原子和分子。那些具有与热表面的功函相当的电离势或电子亲和力的组成和/或杂质原子和分子,被表面电离,并以正或负离子的爆发形式从表面发射出来,然后通过常规方法进行检测,包括通过电子倍增器或质谱检测器在电极上检测轻离子。在要检测负离子的地方,施加磁场以防止来自热表面的电子到达检测器。

著录项

  • 公开/公告号US3973121A

    专利类型

  • 公开/公告日1976-08-03

    原文格式PDF

  • 申请/专利权人 FITE;WADE L.;MYERS;RICHARD L.;

    申请/专利号US19740465163

  • 发明设计人 WADE L. FITE;RICHARD L. MYERS;

    申请日1974-04-29

  • 分类号H01J39/34;

  • 国家 US

  • 入库时间 2022-08-23 01:30:24

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