SEED AND ARRANGEMENTS FOR MEASURING A PREPARED PARAMETER OF A HALF-LEADING MATERIAL

摘要

1530502 Measuring semi-conductor parameters POST OFFICE 1 March 1977 [6 April 1976] 13948/76 Addition to 1482929 Heading G1U For investigating the composition of semiconductor material, an electrolyte is used to form a Schottley barrier diode on the surface of a sample, a variable frequency mono-chromatic light is shone on to the surface, and the resulting photovoltage is measured. The embodiment uses the same electrolytic cell as disclosed in Specification 1482929, and is used in combination with that apparatus. By producing photovoltage/frequency plots (Fig. 4) at various levels in the sample, donor concentration, fractional composition and epilayer thickness can be determined.