首页> 外国专利> Brief description of the superfinishing of the surfaces of semi-finished - conductors, in particular of the surfaces of gallium arsenide of orientation (111)

Brief description of the superfinishing of the surfaces of semi-finished - conductors, in particular of the surfaces of gallium arsenide of orientation (111)

机译:半成品导体表面的超精加工的简要说明,尤其是取向为(111)的砷化镓表面的超精加工

摘要

1493905 Polishing semi-conductor surfaces WACKER-CHEMITRONIC GES FUR ELEKTRONIK-GRUNDSTOFFE mbH 26 July 1976 [1 Sept 1975] 31056/76 Heading B3D [Also in Division C4] A process for polishing a surface of a semiconductor body comprises polishing the surface by means of a polishing agent comprising a mixture of (i) an aqueous suspension containing one or more of the following: quartz, a silicon, a silicate and a fluorosilicate, and having a pH within the range from 6 to 8, and (ii) an aqueous solution of hydrogen peroxide having a pH within the range from 6 to 8. The aqueous suspension (i) is prepared by mixing 1 part by weight of the quartz, silica, silicate or fluorosilicate with from 1 to 10, preferably 3 to 5, parts of water and adjusting the pH value to 6 to 8, and preferably 6À5 to 7À5, using an acid such as phosphoric, sulphuric, acetic, oxalic or hydrochloric acid. The silicates may be of metals of Groups IIa (Be, Mg, Ca, Sr, Ba), IIb (Zn, Cd), IIIa (Sc, Y, La) and IIIb (B, Al, Ga, In) or heavy metal silicates of zirconium, iron, lead, nickel, cobalt, magnesium, calcium, strontium, barium, zinc, and aluminium, and the fluorosilicates be of metals of Groups Ia (Li, Na, K, Rb, Cs, Fr), Ib (Cu, Ag, Au), IIa, IIb, IIIa and IIIb, e.g. sodium, potassium, magnesium, calcium, barium, aluminium, and zinc. Silica gels and solutions, and quartz powder may be used in the polishing agent. The aqueous solution (ii) may contain from 5 to 30% by weight hydrogen peroxide, the pH value being adjusted to 6 to 8, preferably 6À5 to 7À5 by using an alkali such as aqueous sodium hydroxide, aqueous potassium hydroxide or aqueous ammonia. The suspension (i) and solution (ii) may be raised and stored or, preferably, supplied by pumps to the polishing machine and mixed immediately prior to use, the mixture containing 2 to 15%, preferably 4 to 8%, by weight hydrogen peroxide. The polishing machine may have either polishing discs or cloths. The semiconductors to be polished may be of gallium arsenide, silicon and germanium which may or may not contain a dopant such as tellurium, chromium or selenium. In an example of the polishing agent, 5 litres of waterglass having 30% by weight SiO 2 and 2À5 kg of calcium chloride hexahydrate were suspended in 40 litres of water and the pH adjusted to 7 using concentrated hydrochloric acid. Thirty litres of a 30% by weight aqueous hydrogen peroxide solution were then adjusted to a pH of 7 using an aqueous ammonia solution. The two solutions were conveyed separately to the polishing machine and mixed immediately before flowing on to the semi-conductor discs to be polished.
机译:1493905抛光半导体表面WACKER-CHEMITRONIC GES FUR ELEKTRONIK-GRUNDSTOFFE mbH 1976年7月26日[1975年9月1日] 31056/76标题B3D [也在C4分部中]抛光半导体本体表面的方法包括用以下方法抛光表面:抛光剂,其包含以下的混合物:(i)包含以下一种或多种的水悬浮液:石英,硅,硅酸盐和氟硅酸盐,并且具有6至8的pH值,和(ii) pH值为6至8的过氧化氢水溶液。通过将1重量份的石英,二氧化硅,硅酸盐或氟硅酸盐与1至10,优选3至5混合来制备水悬浮液(i)。部分水,并使用诸如磷酸,硫酸,乙酸,草酸或盐酸之类的酸将pH值调节至6至8,优选6至5至7至5。硅酸盐可以是IIa(Be,Mg,Ca,Sr,Ba),IIb(Zn,Cd),IIIa(Sc,Y,La)和IIIb(B,Al,Ga,In)的金属或重金属锆,铁,铅,镍,钴,镁,钙,锶,钡,锌和铝的硅酸盐,氟硅酸盐属于Ia(Li,Na,K,Rb,Cs,Fr),Ib( Cu,Ag,Au),IIa,IIb,IIIa和IIIb,例如钠,钾,镁,钙,钡,铝和锌。可以在抛光剂中使用硅胶和溶液以及石英粉。水溶液(ii)可含有5至30重量%的过氧化氢,通过使用碱如氢氧化钠水溶液,氢氧化钾水溶液或氨水将pH值调节至6至8,优选6至5至7至5。可以将悬浮液(i)和溶液(ii)提起并储存,或者优选通过泵将其提供给抛光机,并在使用前立即进行混合,该混合物含有2-15重量%,优选4-8重量%的氢过氧化物。抛光机可能有抛光盘或布。待抛光的半导体可以是砷化镓,硅和锗,它们可以包含或可以不包含诸如碲,铬或硒的掺杂剂。在抛光剂的实例中,将5升具有30重量%的SiO 2和2-5kg氯化钙六水合物的水玻璃悬浮在40升水中,并使用浓盐酸将pH调节至7。然后使用氨水溶液将30升30重量%的过氧化氢水溶液调节至pH 7。两种溶液分别输送到抛光机并在流到要抛光的半导体圆盘之前立即混合。

著录项

  • 公开/公告号FR2322456A1

    专利类型

  • 公开/公告日1977-03-25

    原文格式PDF

  • 申请/专利号FR19760026212

  • 发明设计人

    申请日1976-08-31

  • 分类号H01L21/302;

  • 国家 FR

  • 入库时间 2022-08-22 23:48:30

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