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APPARATUS AND METHOD OF TRANSFORMING THICKNESS INDICATING NONNLINEAR ANALOG SIGNAL TO THICKNESS INDICATING LINEAR ANALOG SIGNAL
APPARATUS AND METHOD OF TRANSFORMING THICKNESS INDICATING NONNLINEAR ANALOG SIGNAL TO THICKNESS INDICATING LINEAR ANALOG SIGNAL
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机译:将指示非线性模拟信号的厚度转换为指示线性模拟信号的厚度的装置和方法
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摘要
The disclosed linearization system and process converts a high resolution non-linear analog input signal, representative of the thickness of an object, into a high resolution linear analog output signal suitable for use in driving a variety of output devices. The system requires only a small amount of memory for storing pre-calculated non-linear correction coefficients. Prior art linearization systems typically require large memory configurations and/or powerful computers to develop the output signal from the non-linear input. The known systems do not take advantage of the high resolution inherent in the input signal. The disclosed system "channels" the input signal to separate circuit paths so that it may be used directly to; (1) locate an appropriate correction coefficient; (2) develop a correction term after an appropriate correction coefficient is located; and (3) develop a linearized signal having the same high resolution inherent in the input signal. Finally, the disclosed system processes the linearized signal to compensate for the possible errors introduced by radiation source noise. The processed linearized signal is the high resolution linear analog output signal which accurately represents the thickness of the object being gauged.
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