首页> 外国专利> APPARATUS AND METHOD OF TRANSFORMING THICKNESS INDICATING NONNLINEAR ANALOG SIGNAL TO THICKNESS INDICATING LINEAR ANALOG SIGNAL

APPARATUS AND METHOD OF TRANSFORMING THICKNESS INDICATING NONNLINEAR ANALOG SIGNAL TO THICKNESS INDICATING LINEAR ANALOG SIGNAL

机译:将指示非线性模拟信号的厚度转换为指示线性模拟信号的厚度的装置和方法

摘要

The disclosed linearization system and process converts a high resolution non-linear analog input signal, representative of the thickness of an object, into a high resolution linear analog output signal suitable for use in driving a variety of output devices. The system requires only a small amount of memory for storing pre-calculated non-linear correction coefficients. Prior art linearization systems typically require large memory configurations and/or powerful computers to develop the output signal from the non-linear input. The known systems do not take advantage of the high resolution inherent in the input signal. The disclosed system "channels" the input signal to separate circuit paths so that it may be used directly to; (1) locate an appropriate correction coefficient; (2) develop a correction term after an appropriate correction coefficient is located; and (3) develop a linearized signal having the same high resolution inherent in the input signal. Finally, the disclosed system processes the linearized signal to compensate for the possible errors introduced by radiation source noise. The processed linearized signal is the high resolution linear analog output signal which accurately represents the thickness of the object being gauged.
机译:所公开的线性化系统和过程将代表物体厚度的高分辨率非线性模拟输入信号转换为适合于驱动各种输出设备的高分辨率线性模拟输出信号。该系统仅需要少量的存储器来存储预先计算的非线性校正系数。现有技术的线性化系统通常需要大的存储器配置和/或功能强大的计算机以从非线性输入产生输出信号。已知系统没有利用输入信号中固有的高分辨率。所公开的系统将输入信号“引导”到单独的电路路径,以便可以将其直接用于; (1)找到合适的校正系数; (2)在找到适当的校正系数后制定校正项; (3)产生线性信号,该线性信号具有与输入信号相同的高分辨率。最后,所公开的系统处理线性化的信号以补偿由辐射源噪声引入的可能的误差。处理后的线性化信号是高分辨率线性模拟输出信号,可准确表示要测量的物体的厚度。

著录项

  • 公开/公告号JPS5395056A

    专利类型

  • 公开/公告日1978-08-19

    原文格式PDF

  • 申请/专利权人 SANGAMO WESTON;

    申请/专利号JP19770149795

  • 发明设计人 JIYOSEFU EE PANARERO;

    申请日1977-12-13

  • 分类号G01B15/02;G01D3/02;G01N23/06;

  • 国家 JP

  • 入库时间 2022-08-22 23:03:54

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