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Repairing phosphorus-doped silicon monocrystal lattice defects - by heating to temper crystal at temp. dependent on neutron irradiation conditions

机译:修复磷掺杂的硅单晶晶格缺陷-通过在一定温度下加热回火晶体。取决于中子辐照条件

摘要

Crystal lattice defects are repaired in silicon monocrystals by tempering, where the Si has been doped with the phosphorous isotope 31P by neutron irradiation. The Si is heated for =30 minutes at a min. temp. (T1) which depends on the irradication conditions, viz. the ratio(R) of thermal neutrons: fast neutrons, and on the carbon content in the Si. Where R is 100:1 or 99% thermal neutrons, T1 is pref. 700 degrees C. irrespective of the %C. Where R is between 1:1 and 10:1, T1 is 1100 degrees C. for a C content of 3 x 1016 atoms/cm3, and 750-1000 degrees C. for C content 3 x 1016 atoms/cm3. For r between 10:1 and 100:1, T1 is 1000 degrees C. for a C content 3 x 1016 atoms/cm3, and 750 degrees C for a C content 3 x 1016 atoms/cm3. The tempering treatment is pref. independent of the furnace atmos. Used e.g. in the mfr. of semiconductor elements and devices. Stable electrical properties are obtd.
机译:通过回火可修复单晶硅中的晶格缺陷,其中硅已通过中子辐照掺杂了磷同位素31P。将Si至少加热≥30分钟。温度(T1)取决于照射条件,即。热中子与快中子之比以及硅中的碳含量。如果R为100:1或> 99%的热中子,则T1为优选。不论%C如何,均为700摄氏度。当R在1:1和10:1之间时,对于C含量> 3×1016原子/ cm 3,T1为1100℃,对于C含量为3×1016原子/ cm3,T1为750-1000℃。对于介于10:1和100:1之间的r,对于C含量> 3 x 1016原子/ cm3,T1为1000摄氏度;对于C含量为3 x 1016原子/ cm3,T1为750摄氏度。回火处理是优选的。独立于炉膛气氛。用过的在mfr。半导体元件和器件。保持稳定的电性能。

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