首页> 外国专利> Standardising arrangement for twin beam photometer - deflects reference beam to measuring photocell for initial arrangement and includes shutter to interrupt either beam

Standardising arrangement for twin beam photometer - deflects reference beam to measuring photocell for initial arrangement and includes shutter to interrupt either beam

机译:双光束光度计的标准化布置-将参考光束偏转到测量光电管以进行初始布置,并包括用于中断任一光束的快门

摘要

In a twin-beam photo-meter, a light source (1) radiates a beam of light to a beam splitter (2) at which it is divided into a measuring beam (4) and a reference beam (5). The measuring beam is reflected by a device such as a mirror (3) and passes through a cuvette (6) which contains the sample to be measured. The transmitted beam (4') impinges on a photocell (8). The reference beam (5) pases through a cuvette (7) containing the reference standard to a second beam splitter (9). The transmitted reference beam (5') impinges on a second photocell (12). The deflected reference beam passes to the first photocell (8) by way of a second mirror (10). A shutter device (11) pivots to interrupt either the beam from the measuring cell or the beam from the reference cell to permit the two photocells to be set up initially.
机译:在双光束光度计中,光源(1)将光束辐射至分束器(2),在分束器处将其分为测量光束(4)和参考光束(5)。测量光束被诸如镜子(3)之类的装置反射,并穿过比色皿(6),该比色皿包含待测样品。透射光束(4')入射到光电管(8)上。参考光束(5)穿过装有参考标准的比色杯(7)到达第二分束器(9)。发射的参考光束(5')入射到第二光电管(12)上。偏转的参考光束通过第二反射镜(10)到达第一光电管(8)。快门装置(11)枢转以中断来自测量单元的光束或来自参考单元的光束,以允许最初设置两个光电单元。

著录项

  • 公开/公告号DE2721909A1

    专利类型

  • 公开/公告日1978-11-23

    原文格式PDF

  • 申请/专利权人 PHILIPS PATENTVERWALTUNG GMBH;

    申请/专利号DE19772721909

  • 发明设计人 KIEWELWERNERDIPL.-PHYS.;

    申请日1977-05-14

  • 分类号G01J1/00;G01J1/36;G01N21/22;

  • 国家 DE

  • 入库时间 2022-08-22 19:50:44

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