首页> 外国专利> Rotatable table for automatic tester - holds semiconductor wafers which can be electronically heated or cooled and subjected to pressure or vacuum

Rotatable table for automatic tester - holds semiconductor wafers which can be electronically heated or cooled and subjected to pressure or vacuum

机译:自动测试仪的可旋转工作台-容纳可以电子加热或冷却并承受压力或真空的半导体晶片

摘要

The rotatable table holds semiconductor wafers etc., and consists of a stationary and a rotatable part, with a bearing plate. It has a heater for the water and a pneumatic device generating pressure or vacuum in recesses in the bearing plate. The wafer heater is in the rotatable part, and can be switched to a cooling operation. The rotatable part has a cable connecting the electric heating/cooling device with the stationary part. The rotatable part can also have a pneumatic connector coupled to the recesses in the bearing plate and the pneumatic device.
机译:可旋转台保持半导体晶片等,并且由固定的和可旋转的部分以及支承板组成。它有一个用于水的加热器和一个在轴承板上的凹槽中产生压力或真空的气动装置。晶片加热器在可旋转部分中,并且可以切换到冷却操作。可旋转部分具有将电加热/冷却装置与固定部分连接的电缆。可旋转部件还可以具有气动连接器,该气动连接器联接到轴承板和气动装置中的凹部。

著录项

  • 公开/公告号DE2753684A1

    专利类型

  • 公开/公告日1979-06-07

    原文格式PDF

  • 申请/专利权人 REITINGERERICH;

    申请/专利号DE19772753684

  • 发明设计人 REITINGERERICH;

    申请日1977-12-02

  • 分类号G01R31/26;

  • 国家 DE

  • 入库时间 2022-08-22 19:47:48

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