首页> 外国专利> Increased depth of focus and resolution in light microscopes - images any object planes with powerful magnifications

Increased depth of focus and resolution in light microscopes - images any object planes with powerful magnifications

机译:在光学显微镜中提高了聚焦深度和分辨率-以强大的放大倍率成像任何物体平面

摘要

The image of an object is scanned point-by-point by means of a single-or multi-hole scanning diaphragm, which lies in a plane conjugated to the plane onto which the objective is focussed. The scanning diaphragm also scans the surface area of the object by means of a light spot pattern. The scanning of the object image and/or the object takes place in a direction (X and/or Y direction) parallel to the focussed plane, alternatively vertical to the focussed plane (Z direction). Scanning in the Z direction is by means of a periodic displacements of the object and/or the objective.
机译:借助单孔或多孔扫描光阑逐点扫描物体的图像,该光阑位于与物镜聚焦的平面共轭的平面上。扫描膜片还通过光斑图案扫描物体的表面。物体图像和/或物体的扫描在平行于聚焦平面的方向(X和/或Y方向)上进行,或者垂直于聚焦平面(Z方向)进行。在Z方向上的扫描借助于物体和/或物镜的周期性位移。

著录项

  • 公开/公告号FR2253221B1

    专利类型

  • 公开/公告日1978-12-29

    原文格式PDF

  • 申请/专利权人 IBM;

    申请/专利号FR19740039728

  • 发明设计人

    申请日1974-10-16

  • 分类号G02B21/00;G02B27/40;

  • 国家 FR

  • 入库时间 2022-08-22 19:39:27

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