首页> 外国专利> INSPECTION METHOD OF DEPTH FOR PEENING MACHINED LAYER AT INTERNAL SURFACE OF TUBE

INSPECTION METHOD OF DEPTH FOR PEENING MACHINED LAYER AT INTERNAL SURFACE OF TUBE

机译:管内表面刺穿机械层深度检测方法

摘要

PURPOSE:To make quantitative judgement for continuous inspection of non-destructive method, by detecting the unbalanced potential produced at the bridge circuit with eddy current. CONSTITUTION:After balancing the bridge circuit BRG, the reference tube of machined layer depth zero and the tube known for the machined depth t1 are inserted for the coils L1 and L2 of which impedance is changed with eddy current. The output level of the DC amplifiers DAX, DAY at that time is obtained, and similarly with the tube known for the machined depth t2 and inserted for the coil L2, the output level of the amplifiers DAX and DAY is obtained. Next, as to the tube to be inspected, the inspection is conducted as the same steps as mentioned above to check whether the output level of the amplifiers DAX, DAY at that time is between both output levels for the machined depths t1 and t2 or not. Thus, the depth of machined layer can quantiatively be judged.
机译:目的:通过检测电涡流在桥式电路上产生的不平衡电位,对连续检查无损方法做出定量判断。组成:平衡电桥电路BRG之后,将加工层深度为零的参考管和已知加工深度为t1的管插入到线圈L1和L2,其阻抗随涡流而变化。获得当时的DC放大器DAX,DAY的输出电平,并且类似于对于加工深度t2已知并且插入到线圈L2中的管,获得了放大器DAX和DAY的输出电平。接下来,对于待检查的管,以与上述相同的步骤进行检查,以检查当时的放大器DAX,DAY的输出水平是否在加工深度t1和t2的两个输出水平之间。 。因此,可以定量地判断加工层的深度。

著录项

  • 公开/公告号JPS557630A

    专利类型

  • 公开/公告日1980-01-19

    原文格式PDF

  • 申请/专利权人 SUMITOMO METAL IND;

    申请/专利号JP19780080028

  • 发明设计人 TANAKA HIDEAKI;HIYOUDOU SHIGETOSHI;

    申请日1978-06-30

  • 分类号G01N27/72;

  • 国家 JP

  • 入库时间 2022-08-22 18:43:46

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