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Method and apparatus for measuring the flatness of the roughness or of the curvature radius the measuring surface

机译:用于测量测量表面的粗糙度或曲率半径的平坦度的方法和设备

摘要

Two radiation components differing from each other with regard to their state of polarization or their wavelength are directed onto closely adjacent points of the object to be measured. The reflected components are recombined and are fed to a polarization- or wavelength-dependent phase shifter periodically shifting the phase positions of the two components by lambda /2 against each other. A phase shift of one of the components caused by the object to be measured is fully compensated for by periodically shifting the phase position of the other component at particular points in time, which can be determined, for example, by means of a connected analyzer and a photodetector. The values of the control voltage effecting the periodical phase shift in the phase shifter are measured at those points in time at which the phase difference between the two components equals zero. These values are proportional to the difference in height between the points of incidence of the two radiation components on the object surface or the slope of the object surface.
机译:在偏振状态或波长方面互不相同的两个辐射分量被定向到要测量的对象的紧邻点上。反射的成分被重新组合,并被馈送到依赖于偏振或波长的移相器,从而使两个成分的相位彼此相对地偏移λ/ 2。通过在特定的时间点定期移动其他组件的相位,可以完全补偿由要测量的物体引起的其中一个组件的相移,这可以例如通过连接的分析仪确定。光电探测器。在两个分量之间的相位差等于零的那些时间点测量影响移相器中的周期性相移的控制电压的值。这些值与物体表面上两个辐射分量的入射点之间的高度差或物体表面的斜率成比例。

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