首页> 外国专利> Printed circuit tester housing test contacts - has sealed diaphragm pressed down on to board to ensure connection with contact pins

Printed circuit tester housing test contacts - has sealed diaphragm pressed down on to board to ensure connection with contact pins

机译:印刷电路测试仪的外壳测试触点-密封膜片向下压在板上,以确保与接触针的连接

摘要

The printed circuit tester includes a rigid metal frame (3) which may be attached to a work surface (2) on top of which a further section houses the electrical terminals making contact with the circuit board. A locking lever (7) is arranged to clamp the lower two sections together, whilst a clamp mechanism on the uppermost part of the frame (10) holds the upper part of the frame together. On the top surface of the upper frame section (6) of the rectangular frame is a flexible diaphragm. The circuit to be tested is held beneath the diaphragm pressing down on to the test contacts. By evacuation of the space under the diaphragm, pressure is applied to the upper surface of the circuit board to urge it against the test contacts. Connection wires from the test contacts are fed out of the back of the lower part of the rigid rectangular frame.
机译:印刷电路测试仪包括刚性金属框架(3),该框架可以连接到工作表面(2),在该工作表面的另一部分中容纳与电路板接触的电端子。布置了锁定杆(7)以将下部的两个部分夹紧在一起,而在框架(10)的最上部的夹紧机构将框架的上部保持在一起。在矩形框架的上框架部分(6)的顶表面上是柔性隔膜。要测试的电路保持在膜片下方,并向下按压测试触点。通过抽空膜片下方的空间,将压力施加到电路板的上表面,以使其紧靠测试触点。来自测试触点的连接线从刚性矩形框架下部的背面引出。

著录项

  • 公开/公告号FR2453417A1

    专利类型

  • 公开/公告日1980-10-31

    原文格式PDF

  • 申请/专利权人 SODETEG TAI;

    申请/专利号FR19790008792

  • 发明设计人 MICHEL JAMET;

    申请日1979-04-06

  • 分类号G01R31/28;H05K13/08;

  • 国家 FR

  • 入库时间 2022-08-22 17:18:13

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