首页> 外国专利> Full grid cassette for a parallel tester for testing a non-componented printed circuit board, spring contact pin for such a full grid cassette and adapter for a parallel tester for testing a non-componented printed circuit board

Full grid cassette for a parallel tester for testing a non-componented printed circuit board, spring contact pin for such a full grid cassette and adapter for a parallel tester for testing a non-componented printed circuit board

机译：用于测试无成分印刷电路板的并行测试仪的全栅格盒，用于这种全栅格检测盒的弹簧接触针和用于测试无成分印刷电路板的并行测试仪的适配器

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摘要

The invention relates to a full grid cassette for a parallel tester for testing a non-componented printed circuit board, to a spring contact pin for such a full grid cassette and to an adapter for a parallel tester for testing a non-componented printed circuit board.

机译：本发明涉及一种用于测试无成分印刷电路板的平行测试仪的全栅格盒，涉及用于这种全栅格盒的弹簧接触销，以及用于测试无成分印刷电路板的并行测试仪的适配器。。

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公开/公告号US8749259B2

专利类型
公开/公告日2014-06-10

原文格式PDF
申请/专利权人 ANDREAS GÜLZOW;RÜDIGER DEHMEL;
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申请/专利号US20080681295
发明设计人 RÜDIGER DEHMEL;ANDREAS GÜLZOW;
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申请日2008-09-29
分类号G01R31/20;
国家 US
入库时间 2022-08-21 16:00:15

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