JUDGING METHOD OF CAUSES OF FAULTIN NONELECTROLYTIC PLATING

摘要

PURPOSE:To effect an accurate and quick judgement of the causes of faulty plating by measuring the initial reaction of nonelectrolytic plating from the quantity of light transmitted through the material and plating time during nonelectrolytic plating of transparent or semitransparent material. CONSTITUTION:Nonelectrolytic plating solution 5 is charged in a beaker 1, stirred with rotator 4, and transparent or semitransparent material 6 is immersed in the solution. From the projector 7, parallel light beam is projected onto the material 6, and transmitted light is received by the receptor 9. The quantity of light is converted to voltage by the prebox 10, and is recorded by the recorder 11. Plating intial reaction that affects plate thickness is controlled by plating metal ion concentration in nonelectrolytic plating solution, sensitizing time of the material 6, and the succeeding washing time. Thus, the change in plating thickness with time is accurately measured by the transmitted light quantity, so that the causes of faulty plating are adequately detected and proper counteractions can be provided.