首页> 外国专利> METHOD FOR REDUCING MAGNETISM RESISTANT FORCE OF LIQUIDDPHASE EPITAXIAL GARNET FILM

METHOD FOR REDUCING MAGNETISM RESISTANT FORCE OF LIQUIDDPHASE EPITAXIAL GARNET FILM

机译:降低液体相石榴石薄膜磁阻力的方法

摘要

PURPOSE:To reduce the magnetism resistant force by annealing a liquid-phase Ga epitaxial film containing Bi ions Bi3+ at a 24C position at 800 deg.C or more. CONSTITUTION:A liquid-phase Ga epitaxial film containing Bi ions Bi3+ at a 24C position is annealed at a temperature of 800 deg.C or more. The magnetism resistant force of a Bi substituted liquid-phase epitaxial layer is generally high. The magetism resistant force by a magnetic domain modulating method using an AC magnetic field in the liquid-phase Ga epitaxial film of Tm2.4Bi0.6Fe3.85Ga1.15O12 is 2.5 Oe. In the case the magnetism resistant force is large as mentioned above, there is a drawback that the printing pattern is remained even after the magnetic tape has been removed from the Ga film. The large magnetism resistant force of Bi substituted Ga is caused by irregular placement of the Bi ion Bi3+ whose radius is large at the position 24C of a Ga lattice and by partial distortion of the lattice. Such distortion can be eliminated by the annealing, thereby the magnetism resistant force can be reduced.
机译:目的:通过在800℃或更高的24℃温度下对包含Bi离子Bi 3+的液相Ga外延膜进行退火来降低抗磁性。组成:在24℃位置含有Bi离子Bi 3+的液相Ga外延膜在800℃以上的温度下退火。 Bi取代的液相外延层的耐磁力一般较高。在Tm2.4Bi0.6Fe3.85Ga1.15O12的液相Ga外延膜中,利用交流磁场通过磁畴调制法产生的抗机械腐蚀力为2.5Oe。在如上所述的抗磁性力大的情况下,存在即使在从Ga膜上去除了磁带之后仍保留印刷图案的缺点。 Bi取代的Ga的大的耐磁力是由半径较大的Bi离子Bi 3+在Ga晶格的位置24C处的不规则配置和晶格的部分变形引起的。通过退火可以消除这种变形,从而可以减小抗磁性力。

著录项

  • 公开/公告号JPS5646518A

    专利类型

  • 公开/公告日1981-04-27

    原文格式PDF

  • 申请/专利权人 NIPPON ELECTRIC CO;

    申请/专利号JP19790122860

  • 发明设计人 HIBIYA TAKETOSHI;

    申请日1979-09-25

  • 分类号C30B29/28;H01F10/24;H01F41/28;

  • 国家 JP

  • 入库时间 2022-08-22 16:30:55

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