TESTOR FOR MICROPROCESSOR-BASED SYSTEMS.

摘要

Automated test device (10) is coupled to the real time monitoring of system (14) (14) test macro performance based on microprocessor of Bidirectional inner data and control bus (26) programming. The signal of bus (26) responds, the real-time comparison signal response (12) of known better systems on bus (26) the unknown system (14) tested in order to identify failure. Fault Isolation by sequential algorithm, which stops operation the failure of specified generation, usual Fisrt fault, and the malfunctioning sub-system or component that therefore track the error cause are in test system to be measured (14) offer indicated error signal bidirectional bus (26).