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Appts. for measuring thickness of film - using black body IR radiator with film displaced across cavity aperture

机译:Appts。用于测量膜的厚度-使用黑体红外辐射器,使膜在腔孔中移动

摘要

The appts. for measuring the thickness of a film on a support comprises a black-body infrared radiator (17) having an isothermal cavity with an aperture which the film (1) to be examined may be passed. An observation hole (18) is positioned so that part of the region covered by the aperture may be scanned through the hole and a pyrometer (8) scans a restricted region through this observation hole (18). The minimum distance between the perimeter of the aperture opposite which the film is displaced and the part of the region mentioned above is equal to several times the maximum dimension of the restricted region scanned by the pyrometer. The infrared radiation emitted has a major wavelength content around 3,4 mu m.
机译:苹果。用于测量载体上的膜的厚度的装置包括黑体红外辐射器(17),该黑体红外辐射器具有等温腔,该腔具有带孔,待检查的膜(1)可以通过。放置观察孔(18),使得可以通过孔扫描由孔覆盖的区域的一部分,并且高温计(8)通过该观察孔(18)扫描受限区域。膜相对的孔的周长与上述区域的一部分之间的最小距离等于高温计扫描的限制区域的最大尺寸的几倍。发出的红外辐射的主要波长含量约为3.4微米。

著录项

  • 公开/公告号FR2356909B1

    专利类型

  • 公开/公告日1982-03-05

    原文格式PDF

  • 申请/专利权人 IRGON INC;

    申请/专利号FR19760019933

  • 发明设计人

    申请日1976-06-30

  • 分类号G01B11/06;

  • 国家 FR

  • 入库时间 2022-08-22 12:32:21

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