首页> 外国专利> Method for removing borosilicate and boron rich oxides from a silicon body prior to doping silicon bodies with a SiB.sub.6 solid source

Method for removing borosilicate and boron rich oxides from a silicon body prior to doping silicon bodies with a SiB.sub.6 solid source

机译:在用SiB.sub.6固体源掺杂硅体之前从硅体中除去硼硅酸盐和富硼氧化物的方法

摘要

A method for doping silicon bodies by the diffusion of boron into the bodies is described. The method is an improvement of processes where the silicon bodies are exposed in a first heating process to a gas mixture containing a predetermined boron quantity and boron and oxygen in a predetermined quantitative ratio and a second heating process is used to drive the boron into the silicon. In the method, a borosilicate glass layer and a boron-rich silicon dioxide layer are removed by first immersing the silicon body in hydrofluoric acid diluted with water and subsequently in an aqueous sulfuric acid/potassium permanganate solution.
机译:描述了一种通过硼扩散进入硅体来掺杂硅体的方法。该方法是对工艺的改进,在该工艺中,将硅体在第一加热过程中暴露于包含预定硼量以及以预定定量比的硼和氧的气体混合物中,并使用第二加热过程将硼驱入硅中。在该方法中,通过首先将硅体浸入用水稀释的氢氟酸中,然后浸入硫酸/高锰酸钾水溶液中,除去硼硅酸盐玻璃层和富含硼的二氧化硅层。

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