DOUBLE THREE-SIDE MIRROR SYSTEM OF OPTICAL INSTRUMENTS MAINLY DOUBLE-LIGHT INTERFEROMETERS

• 1. 基于压缩态光源结构与双透射光结构的迈克尔逊干涉仪 [P] . 中国专利： CN214224163U . 2021-09-17
• 2. 一种用于对抛型冷原子干涉仪的双拉曼光装置 [P] . 中国专利： CN213932856U . 2021-08-10
• 3. Determination of at least an optical property of a substrate, especially inhomogeneity of material refractive index, using interferometer measurement system with a mirror that is laterally displaced between measurements [P] . 德国专利： DE102004057442A1 . 2005-04-14

  机译： 使用干涉仪测量系统确定至少基材的光学特性，特别是材料折射率的不均匀性，该系统具有在测量之间横向移位的反射镜

• 4. OPTICAL TEST SYSTEM INCLUDING INTERFEROMETER WITH MICROMIRROR AND PIEZOELECTRIC TRANSLATOR FOR CONTROLLING TEST PATH MIRROR [P] . 日本专利： JP2003177006A . 2003-06-27

  机译： 包含微镜干涉仪和压电翻译器的光学测试系统，用于控制测试路径反射镜

• 5. OPTICAL TEST SYSTEM INCLUDING INTERFEROMETER WITH MICRO-MIRROR [P] . PT814331E . 2001-10-31

  机译： 光学测试系统，包括带微镜的干涉仪

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